Showing results: 1666 - 1680 of 2372 items found.
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iOptics -
EXFO Inc.
iOptics offers a complete, powerful and easy-to-use tool for CFP and QSFP qualification and can validate the full range of low- to high-rate transceivers including SFP, SFP+, XFP, CFP, CFP2, CFP4, QSFP+ and QSFP28. iOptics offers a faster, streamlined and automated test sequence aimed at quickly and simply validating any type of 10M to 100G interface. It is the ideal solution for multirate field commissioning with a simple one-button pass/fail. It offers automated stress testing for lab qualification and is also ideally suited for data center and data center interconnect (DCI) testing.
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Cuming-Lehman Chambers
It’s nearly impossible to perform VHF/UHF measurements in a rectangular chamber. In the 1960’s Emerson determined that tapering one end of an Anechoic Chamber would cause the chamber to act like an indoor ground reflection range.Tapered Chambers work very well at the lower frequencies. Their design forms a uniform illumination across the test region. The tapered end of the chamber forces the wall images close together forming a source antenna array. Tapered Chambers are usually a less expensive option compared to rectangular antenna measurement chambers or compact ranges.
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Elcometer Limited
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Pickering Interfaces Ltd.
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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785185-01 -
NI
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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785185-02 -
NI
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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780180-01 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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779785-01 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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779785-02 -
NI
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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6237 DLRO -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Measure down to 1μΩ.● 6 ranges from 2.000mΩ to 200.0Ω.● Maximum resolution of 1μΩ.● Three test currents with over-temperature protection.● Four terminal measurement.● Protection against inadvertent connection to over- voltage. (crow bars for current and voltage)● Clear & large LCD.● Potential lead resistance and current lead resistance checks.● "Full-featured” EnerSave™ Inside.● EnerSave™ Auto-hold.● EnerSave™ Auto-off.● Rechargeable battery operated● Robust & compact.● Indicators show if reading may be invalid (RP, RC, and temperature).● "O-Ring” sealed case.
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LMS-3000 -
Lisun Electronics Inc.
• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm～780nm(Special:200nm～780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K～25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃～80℃ • Temperature measure range(In sphere): -10℃～100℃
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IDPS750 -
Salland Engineering
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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CMX500 -
Rohde & Schwarz GmbH & Co. KG
The R&S CMX500 radio communication tester is the future-proof solution for 5G NR testing, featuring an intuitive and flexible web-based user interface, the R&S CMsquares. Supporting manual interactive operation as well as automatically sequence-controlled test protocols makes the R&S CMsquares an advantageous software solution, with unique modules for all signaling use cases. These range from R&D design stages up to end-to-end application testing, production and conformance tests. The introduction of a one-platform strategy for all 5G NR test equipment enables a unified test environment for signaling and non-signaling testing through all stages of 5G device production.
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WT-100 -
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
